Designed to Simplify Hardware-in-the-Loop Simulation Applications
Traditional Hardware-In-the-Loop (HIL) Simulation features signal switching to inject faults into a Unit Under Test (UUT).
To make manual measurements and induce a fault manually prior to writing test code, a Breakout Box (BoB) needs to be
added. The majority of the BoBs and Fault Insertion Unit (FIU) switch systems available today are not modular. They are
fixed in configuration, creating a test solution that is not often ideal. In addition, they have cumbersome cable configurations
and, in many cases, expensive.
Modular in a Single Unit
Originally designed in partnership with OPAL-RT Technologies, this Modular
Breakout System combines a BoB feature set with the added flexibility of an FIU. By mating the FIU chassis directly to
the BoB using our plug-in modules, cabling is minimized, creating a more compact, reliable design and improving signal
integrity.
As most UUTs have several different signal types and parameters to be tested, the Modular Breakout System’s design means
you can specify several different voltages and current options in the same chassis. You get to add just what you need
for your test requirements, which can save you money over other designs.
In addition, all cables to the simulation system and the UUT are located behind the front panel of the BoB. This creates
a simpler front panel that is less prone to damage.